DFT and test for safety-critical automotive ICs

September 20, 2013 // By Steve Pateras
The growing quantity and sophistication of automotive electronics, particularly in safety-critical systems is driving higher quality and reliability requirements than ever. Not shipping defective parts has evolved from important to imperative.

To address quality and reliability requirements, automotive IC makers are adopting new quality standards such as ISO 26262 and IEC 61508. Adhering to these standards, in turn, calls for some key updates to traditional design-for-test (DFT) methodologies. Among the updates are two new test methodologies that will become indispensable for safety-critical automotive electronics: cell-aware automatic test pattern generation (ATPG) and hybrid ATPG/logic built-in self-test (BIST).

Read the full article on page 28 of our September digital edition .